Journal of Advances in Nanomaterials
Friction Coefficient Mapping of 2D Materials via Friction-Induced Topographic Artifact in Atomic Force Microscopy
Download PDF (605.9 KB) PP. 73 - 81 Pub. Date: December 20, 2016
Author(s)
- Thales F.D. Fernandes and Bernardo R. A. Neves**
Department of Physics, Universidade Federal de Minas Gerais, C.P. 702, 30123-970 Belo Horizonte, Brazil
Abstract
Keywords
References
[1] V. L. Mironov, “The Fundamentals of Scanning Probe Microscopy,” 2004.
[2] B. Bhushan, “Nanotribology and Nanomechanics: An Introduction,” Springer, 2005.
[3] P. Eaton and P. West, “Atomic Force Microscopy,” Oxford University Press, 2010.
[4] B. R. A. Neves, D. N. Leonard, M. E. Salmon, P. E. Russell, and E. B. Troughton, “Observation of topography inversion in atomic force microscopy of self-assembled monolayers,” Nanotechnology, vol. 10, no. 4, pp. 399–404,1999.
[5] P. Nemes-Incze, Z. Osváth, K. Kamarás, and L. P. Biró, “Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy,” Carbon, vol. 46, no. 11, pp. 435–1442, 2008.
[6] D. H. Lee, M. J. Lee, Y. S. Kim, J. S. Choi, and B. H. Park, “Sample rotation angle dependence of graphene thickness measured using atomic force microscope,” Carbon, vol.
[7] J. S. Choi et al., “Facile characterization of ripple domains on exfoliated graphene,” Review of Scientific Instruments, vol. 83, no. 7, pp. 73905, 2012.
[8] A. P. M. Barboza et al., “Dynamic Negative Compressibility of Few-Layer Graphene, h-BN, and MoS2,” Nano Letters, vol. 12, no. 5, pp. 2313–2317, 2012.
[9] J. E. Sader, J. W. M. Chon, and P. Mulvaney, “Calibration of rectangular atomic force microscope cantilevers,” Review of Scientific Instruments, vol. 70, no. 10, pp. 3967, 1999.
[10] K. S. Novoselov, “Electric Field Effect in Atomically Thin Carbon Films,” Science, vol. 306, no. 5696, pp. 666–669, 2004.
[11] N. Alem, R. Erni, C. Kisielowski, M. D. Rossell, W. Gannett, and A. Zettl, “Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy,” Physical Review B, vol. 0, no. 15, pp. 155425, 2009.
[12] L. Song et al., “Large Scale Growth and Characterization of Atomic Hexagonal Boron Nitride Layers,” Nano Letters, vol. 10, no. 8, pp. 3209–3215, 2010.
[13] D. Berman, A. Erdemir, and A. V. Sumant, “Graphene: a new emerging lubricant,” Materials Today, vol. 17, no. 1, pp. 31–42, 2014.
[14] Y. J. Shin et al., “Frictional characteristics of exfoliated and epitaxial graphene,” Carbon, vol. 49, no. 12, pp. 4070–4073, 2011.
[15] J. M. Gere and S. P. Timoshenko, “Mechanics of Materials, 2nd ed.,” Wadsworth Publishing Co Inc, 1984.
[16] D. Sarid, “Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces,” New York Oxford, 1991.
[17] Y. Mo, K. T. Turner, and I. Szlufarska, “Friction laws at the nanoscale,” Nature, vol. 457, no. 7233, pp. 1116–1119, 2009.
[18] D. L. Sedin and K. L. Rowlen, “Adhesion Forces Measured by Atomic Force Microscopy in Humid Air,” Analytical Chemistry, vol. 72, no. 10, pp. 2183–2189, 2000.